Electronics and information technologies / Електроніка та інформаційні технології

METHOD FOR ESTIMATING THE DOPPLER FACTOR OF A BROADBAND SIGNAL UNDER CONDITIONS OF MULTIPLICATIVE INTERFERENCE WITH UNKNOWN PROBABILITY DISTRIBUTION

MODELING RETAIL SALES USING AUTOREGRESSIVE INTEGRATED MOVING AVERAGE AND LONG SHORT-TERM MEMORY FORECASTING METHODS

OPTIMIZATIONS OF DEEP LEARNING OBJECTS DETECTION MODELS FOR INFERENCE ACCELERATION ON GENERAL-PURPOSE AND HARDWARE-ACCELERATED SINGLE-BOARD PLATFORMS

PARAMETER EFFICIENT FINE-TUNING AND OVERFITTING IN GPT LARGE LANGUAGE MODELS: A METRIC-BASED COMPARISON

PHOTOSENSITIVE STRUCTURES BASED ON THE SILVER-DOPED POROUS SILICON AND REDUCED GRAPHENE OXIDE

SPATIAL-GEOMETRIC EVALUATION OF LOCAL FEATURES IN MONOCULAR VISUAL ODOMETRY

THE ELECTRICAL IMPEDANCE OF A METAL-SILICON STRUCTURE WITH A THIN SiO₂ LAYER

VISION TRANSFORMER-BASED FALL DETECTION: A SPATIAL TEMPORAL ATTENTION MECHANISM FOR ROBUST VIDEO ANALYSIS

INVESTIGATION OF TRAPS IN β-Ga₂O₃:0.05%Cr AND β-Ga_1,9In_0,1O₃:0,05%Cr CRYSTALS BY FRACTIONAL THERMAL-GLOW TECHNIQUE

ANALYSIS OF SPECTRAL AND KINETIC CHARACTERISTICS OF CATHODOLUMINESCENCE OF Y₂O₃:Eu THIN FILMS AS A RED COMPONENT OF FULL-COLOR HIGH-RESOLUTION FLUORESCENT DISPLAYS

DIFFERENTIAL JONES MATRIX FOR CHOLESTERIC

ELECTROLUMINESCENCE FROM OLED BASED ON DCM DERIVATIVE WITH CHEMICAL FORMULA C₂₅H₂₁N₃O₃

INFLUENCE OF THE OBTAINING CONDITIONS ON THE ELECTROCONDUCTIVITY OF Ga₂O₃ THIN FILMS

LIGHT-EMITTING DIODES: CREATION HISTORY, PRESENT AND PROSPECTS
(to the 60th anniversary of the first LED)

LUMINESCENCE OF ACTIVATED THIN Bi₄Ge₃O₁₂ FILMS

THE COMBINED ELLIPSOMETRIC METHOD OF COMPLETE OPTICAL CHARACTERIZATION OF CRYSTALS. III. EXPERIMENTAL DETERMINATION OF THE ORIENTATION OF OPTICAL AXIS IN CRYSTAL

THE COMBINED ELLIPSOMETRIC METHOD OF COMPLETE OPTICAL CHARACTERIZATION OF CRYSTALS.
IV. APPLICATION TO UNIAXIAL CRYSTAL.

THE EXPERT SYSTEM FOR DETERMINATION OF HOTEL ROOM COST

X-RAY LUMINESCENCE OF Tl₄CdI₆ CRYSTALS