SURFACE INHOMOGENEITIES IMPACT ON BALLISTIC CHARGE TRANSPORT IN NANOSIZED METAL FILMS

Roman Bihun, M. Buchkovska, B. Penyukh, O. Koplak, V. Apopii, A. Fareniuk

Abstract


A model approach is proposed that allows to evaluate the influence of parameters of average amplitude h  and correlation length ξ of surface inhomogeneities on the dimensional concentration of electronic states n(d) and specific conductivity sigma(d) of nanoscale metal films at ballistic charge transport regime. According to Fishman- Calecki, the impact of surface inhomogeneities on the regime of ballistic charge transport in nanoscale films of silver, gold and copper was analyzed. The minimum thickness d_c of the metal film for which the application of proposed approach is valid was carried out within percolation theory.

Keywords: thin metal films, size effect, surface inhomogeneities, ballistic transport.


Full Text:

PDF

References


  1. Stasyuk Z. V., Lopatinsky А. І. Size kinetic phenomenon in thin metal films. Physics and chemistry of solid state. 2001. V.2, №4. p.521–541. (in ukr.)
  2. Shpak A.P., Bihun R.I., Stasyuk Z.V., Kunitskyi Yu.A. Structure and electrical conductivity of ultrathin films copper, gold and silver films. Nanosystems, nanomaterials and nanotechnologies. 2010. Vol. 8, No. 2. p. 339-388. (in ukr.)
  3. Tesanovic Z., Jaric M. Vol., Maekawa S.Quantum transport and surface scattering. Phys. Rev. B. 1986. Vol.57, №21. P. 2760–2763.
  4. Tesanovic Z. Surface scattering effects in quantum transport. Solid State Phys. 1987. V.20, №6. P. L829–L834.
  5. Trivedi N., Ashcroft N.W. Quantume size effect in transport properties of metallic films. Phys. Rev. B38. 1988. Vol.4, №17. Р.12298–12309.
  6. Fishman G. D. Calecki D. Surface-induced resistivity of ultrathin metallic films: A limit law. Phys. Rev.Lett. 1989. Vol.62, №11. Р. 1302–1305.
  7. Calecki D. Galvanomagnetic phenomena and surface roughness in thin metallic films. Phys. Rev. B. 1990. Vol.42, №11. P.6906–6915.
  8. Calecki D., Fishman G. Surface-limited resisitivity in 2D-semiconductors and 2D-metals: Influence of roughness modeling. Surf. Sci. V. 220. P.110–112 (1990).
  9. Fishman G., Calecki D. Influence of surface roughness on the conductivity of metallic and semiconducting quasi-two-dimensional structures. Phys. Rev. B. 1991. V.43, №14. Р. 11581–11585.
  10. Bihun R. I., Kunitsky Yu. A., Stasyuk Z. V. Nanosystems, Nanomaterials, Nanotechnologies. 2010. Vol. 8, № 1. c. 129-137. (in ukr.)
  11. Pogrebnyak V.A. Electronic resonances in a quantum well with a periodically uneven boundary. Solid state physics. 1999. vol. 41, issu. 10, pp. 1867-1870.
  12. Hensel J.C., Tung R.T., Poate J.M., Unterwald F.C. Specular Boundary Scattering and Electrical Transport in Single-Crystal Thin Films of CoSi2. Phys. Rev. Lett. 1985. Vol. 54, № 16. P. 1840-1843.
  13. J. Kyoung. Direct in site observation of the percolation transition in VO2 thin films by peak-shift spectroscopy. Optical Materials Express. 2022. Vol. 12, Issue 3. pp. 1065-1073.
  14. M. Walther, D. Cooke, C. Sherstan, M. Hajar, M. Freeman, F. Hegmann. Terahertz conductivity of thin gold films at the metal-insulator percolation transition. Phys. Rev. B. 2007. Vol. 76. p. 125408(1-9).




DOI: http://dx.doi.org/10.30970/eli.22.2

Refbacks

  • There are currently no refbacks.