Danylyuk, H.
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No 12 (2019): Issue 12 - MATERIALS FOR ELECTRONIC ENGINEERING
A POSSIBLE PHYSICAL MECHANISM FOR THE FORMATION OF THE EXPONENTIAL FUNDAMENTAL ABSORPTION EDGE IN INDIRECT GaP SEMICONDUCTORS
Abstract PDF (Українська) -
No 13 (2020): Issue 13 - MATERIALS FOR ELECTRONIC ENGINEERING
THE EFFECT OF UNIAXIAL PRESSURE ON THE OPTICAL PROPERTIES OF SINGLE-CRYSTAL Tl2S IN THE REGION OF FUNDAMENTAL ABSORPTION EDGE. I. EXPERIMENT
Abstract PDF (Українська) -
No 14 (2020): Issue 14 - MATERIALS FOR ELECTRONIC ENGINEERING
THE EFFECT OF UNIAXIAL PRESSURE ON THE OPTICAL PROPERTIES OF SINGLE-CRYSTAL Tl2S IN THE REGION OF FUNDAMENTAL ABSORPTION EDGE. II. THEORETICAL ANALYSIS
Abstract PDF (Українська)
ISSN: 2224-0888

Electronics and information technologies / Електроніка та інформаційні технології