Investigation of the structure
of gallium oxide glasses by means of positron lifetime measurements
Chem.
Met. Alloys 4 (2011) 18-21
https://doi.org/10.30970/cma4.0138
Edmund GOLIS, Jacek FILIPECKI,
Manuela REBEN, Jan WASYLAK
Positron lifetime spectroscopy PALS has been
applied to the investigation of the structure of gallium oxide glasses. Three
components of the positron lifetime t (t1 para- and t3 ortho-positronium and t2 intermediate
lifetime component) and
their intensities I were obtained. The analysis shows that the obtained lifetime
components correspond to the occurrence of free volume holes (t1 and t3) and
positron trapping in vacancy-type defects (t2). From
the Tao-Eldrup formula we can estimate the size of
the free volume. The percentage of intensities of the individual components of
the positron lifetime shows that it is strongly dominated by vacancy-type defects.
DTA curves of PbO–Bi2O3–Ga2O3
glasses.
Keywords
Gallium oxide
glasses / Positron annihilation / Positronium /
Structure of glasses