Investigation of the structure of gallium oxide glasses by means of positron lifetime measurements

Chem. Met. Alloys 4 (2011) 18-21

https://doi.org/10.30970/cma4.0138

Edmund GOLIS, Jacek FILIPECKI, Manuela REBEN, Jan WASYLAK

Positron lifetime spectroscopy PALS has been applied to the investigation of the structure of gallium oxide glasses. Three components of the positron lifetime t (t₁ para- and t₃ ortho-positronium and t₂ intermediate lifetime component) and their intensities I were obtained. The analysis shows that the obtained lifetime components correspond to the occurrence of free volume holes (t₁ and t₃) and positron trapping in vacancy-type defects (t₂). From the Tao-Eldrup formula we can estimate the size of the free volume. The percentage of intensities of the individual components of the positron lifetime shows that it is strongly dominated by vacancy-type defects.

DTA curves of PbO–Bi₂O₃–Ga₂O₃ glasses.

Keywords

Gallium oxide glasses / Positron annihilation / Positronium / Structure of glasses