Interaction of the components in the system Hf–Re–Si

Chem. Met. Alloys 12 (2019) 88-92

https://doi.org/10.30970/cma12.0398

Liana ZINKO, Oksana MATSELKO, Vasyl KORDAN, Galyna NYCHYPORUK, Roman GLADYSHEVSKII

The interaction of the components in the ternary system Hf–Re–Si at 1000°C has been investigated by means of X-ray powder diffraction and scanning electron microscopy with energy-dispersive X-ray spectroscopy. The system is characterized by the formation of solid solutions based on the binary phases. In addition to HfReSi and HfReSi₂, two more ternary phases, with approximate compositions Hf₂₃₍₂₎Re₄₍₁₎Si₇₃₍₁₎ (T1) and Hf₇₁₍₂₎Re₁₈₍₃₎Si₁₁₍₁₎ (T2), were observed. According to the EDXS analysis, the highest solubility of the third component was found for HfRe₂ (up to 36.4 at.% Si) and Re₄Si₇ (up to 23.8 at.% Hf). The ternary phase HfReSi exhibits a significant homogeneity range with an approximately constant Hf content at 1000°C (Hf_{29.1(3)-25.0(4)}Re_{30.3(5)-45(2)}Si_{40.6(8)-30(2)}).

Microstructures of selected samples (BSE images) and compositions of the observed phases.

Keywords

Hafnium / Rhenium / Silicon / X-ray powder diffraction / Scanning electron microscopy