Structural and electrical
characterization of RCu5Sn
compounds (R = Y, Gd,
Tb, Dy, Ho, Er, and Tm)
Chem.
Met. Alloys 12 (2019)
1-8
https://doi.org/10.30970/cma12.0374
I. ROMANIV, L. ROMAKA, B. KUZHEL,
V.V. ROMAKA, M. RUDCHENKO,
Yu. STADNYK, M. KONYK, M. RUDKO
A series of RCu5Sn
intermetallic compounds (R = Y, Gd, Tb, Dy, Ho, Er, and Tm) was synthesized from the elements by arc-melting,
annealed at 870 K and characterized by X-ray powder diffraction and
energy-dispersive X-ray analyses. Rietveld
refinements of the crystal structures showed that the compounds crystallize in
the structure type CeCu5Au (ordered variant of the CeCu6
type, space group Pnma).
Measurements of the electrical resistivity indicated
metallic type of conductivity for all the studied compounds in the temperature
range 11-300 K. Magnetic ordering at low temperature was, when in the
temperature range of the measurements, confirmed by the electrical resistivity measurements. Electronic structure calculations
performed for YCu5Sn are in good agreement with the electrical
transport studies.
Isosurface of the electron localization
function at 0.32 for YCu5Sn.
Keywords
Intermetallics / Crystal structure / X-ray diffraction / Electrical
properties / DFT modeling